
PURITY CONCEPT V
SIKORA PURITY CONCEPT V is an innovative optical offline inspection system designed for laboratory quality control of plastic materials. The device uses a high-quality optical CMOS line-scan color camera with a 50 µm resolution to detect various types of contamination – such as black specks, color deviations, white spots, and other surface impurities – in transparent and colored plastic pellets, flakes, or test plates.
The inspection process is fully automatic and provides detailed visual results on a monitor within seconds, as well as color-coded markings directly on the sample. In addition, the CCA generates a comprehensive test certificate with information on the number, size, and color spectrum of detected contaminations, making it easier to assess material quality and approve it for production or delivery.
Measurement principle: optical CMOS line-scan color camera
Minimum detectable size: ~50 µm (2D)
Detectable contaminations:
Black specks
Color deviations
White spots and other optical defects
Applications: plastic pellets, flakes, films/strips, and test plates
Output: visual display on the monitor + color-coded marking of contaminations on the sample
Test certificate: summary of analysis results (count, size, spectrum)
Operating temperature: +10 °C to +40 °C
Interface: USB (LAN optional)
Power supply: 100–240 V AC ±10%, 50/60 Hz
Dimensions (W×H×D): 1,090 × 575 × 921 mm
Inquiry system
Configure your own product according to your requirements and needs. If you are unsure of the configuration, provide us in the notes the necessary information about the existing sensor or product, even a competitor. We will be happy to help you find an alternative MAAG products. If your request is urgent, let us know. We will do our best to help you resolve this situation to your satisfaction as quickly as possible. If we have all the information, we are able to offer a model with minor differences.
If you need more information do not hesitate to contact us.
MAAG Configuration code
New: SIKORA PURITY CONCEPT V – optical offline inspection of plastics materials
SIKORA PURITY CONCEPT V is a modern optical offline inspection system for laboratory quality control of plastic granules, flakes and test samples. The system reliably detects and analyses contamination and optical deviations from 50 µm – from „black specks“ and color deviations to other surface defects. The result is fast and objective material quality evaluation without the need for manual inspection.
Key benefits of PURITY CONCEPT V in one minute
Why PURITY CONCEPT V – fast inspection without compromise
PURITY CONCEPT V enables detailed inspection of the material before it is released into production. Automatic detection reduces inspection time and increases objectivity of results, leading to higher product quality and fewer complaints.
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